![]() Petrographic analysis services are now available from PTS Labs through our alliance partner, GeoSystems. GeoSystems is a worldwide leader in petrographic analysis, and a strong extension to our in-house capabilities. Petrographical analyses include the following essential services:
Besides offering the essential services as “stand-alone” items, through GeoSystems we offer integrated packages to provide: Thin Section Preparation and AnalysisThis analysis includes a basic petrographic description, including visual estimation of grain size, sorting, porosity and mineral abundances, fabric, rock classification, porosity varieties and abundances. Two (2) color photomicrographs of each sample with complete written descriptions are included. Detailed thin section analysis includes measurement of mean grain size, sorting, and point count determination of mineral abundances and porosity (minimum 300 points per thin section). Results include a determination of Vshale, shale distribution, porosity varieties and abundances with a discussion of diagenesis, diagenetic sequence, porosity origins and development, controls on porosity and permeability. Point count data is presented in tabular form with two (2) color photomicrographs accompanied by detailed photomicrographs descriptions. X-Ray Diffraction AnalysisXRD analysis provides semi-quantitative determination of sample mineralogy. Bulk and clay X-ray diffraction analysis is performed to aide in reservoir description and evaluation of reservoir diagenesis. The data provided in tabular format. Scanning Electron Microscopy AnalysisThe data output includes two (2) photographs at varying magnification documenting significant rock properties, pores, pore throats, clays, framework grains and cements. Deliverables include a complete written description, and elemental abundance from EDS analysis. GPAC (Pore Attribute Characterization) AnalysisThis analysis technique allows for the development of petrophysical properties on cutting and percussion sidewall cores where these measurements cannot be accurately made. This analysis significantly enhances the overall information derived from these type of rock samples. When integrated with thin section and X-ray diffraction analysis, improved understanding of reservoir potential is achieved. This analysis involves the use of backscatter imaging techniques using a scanning electron microscope on ultra polished billets. It is a unique approach that allows for a study of the pore system at much higher levels of magnification than can be obtained from performing this analysis on thin sections. Analysis requires BSI on ultra polished billet and SEM photomicrograph on fresh surface. Data results are presented in both tabular and graphical formats and includes:
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